Sensitivity analysis of divergence of ion beam with respect to changes of shape of acceleration grid in kaufman type ion sources

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Sensitivity analysis of divergence of ion beam with respect to changes of shape of acceleration grid in kaufman type ion sources

Jacek Rońda, Dominik Osiński

Department of Applied Computer Science and Modelling,,University of Science and Technology AGH, Cracow, Poland.

DOI:

https://doi.org/10.7494/cmms.2009.1.0214

Abstract:

This paper presents results of simulation for ion extraction from Kaufman type ion source by using CPO 2DS software. For electric potential and field determination the Boundary Element Method (BEM) implemented in CPO 2DS computer program is used. Simulations are made for different accelerator grid shapes. Variations of plasma meniscus shape and the sensitivity of divergence are analyzed in respect to variations of acceleration grid shape by using a finite difference approximation. The objective of the present work is a verification of influence of grid shape variations on beam divergence by numerical experiment. It is shown that a diameter variation of an acceleration grid aperture does not significantly influence on a divergence of ion beam.

Cite as:

Rońda, J., Osiński, D., (2009). Sensitivity analysis of divergence of ion beam with respect to changes of shape of acceleration grid in kaufman type ion sources. Computer Methods in Materials Science, 9(1), 104 – 109. https://doi.org/10.7494/cmms.2009.1.0214

Article (PDF):

Keywords:

Ion source, Extraction of ion beam from plasma source, Ion beam divergence

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